Keynotes & Papers

Published Paper

2025-Full-chip Voltage Contrast Inference Using Deep Learning; You Only Look Once: Voltage Contrast (YOLO-VC)

Voltage Contrast

,

e-Beam

Keynote Presentation

2024 – Test Innovations: Crossing the Chasm to a Chiplet Ecosystem at 3D Systems Summit

Chiplet ecosystem

,

DFF

,

AI/ML

,

制造分析

Published Paper

2024 – Expediting manufacturing safe launch with Big Data AI/ML analytic solutions on the cloud

Manufacturing

,

Yield Management

Published Paper

EDTM 2022 - 用于检测和监控的新型电子束技术

e-Beam

,

Yield Management

Published Paper

EDTM 2022 - BEOL 叠加和工艺边际特征描述的新方法

Design for Manufacturing

,

Voltage Contrast

Published Paper

NANOTS 2021 - 利用 DirectScan 进行先进的高通量电子束检测

过程控制

,

Design for Manufacturing

,

Voltage Contrast

Published Paper

APCSM 2020 - 将机器学习与先进的异常值检测相结合，提高质量并降低成本

AI/ML

,

Data

Published Paper

IEEE S3S 2019 - FDSOI 技术的表征挑战与解决方案

Yield Management

Published Paper

IEEE JEDS 2019 - 用于鉴定新兴存储器的短流程测试阵列的设计和测量要求

Parametric Test

,

Characterization

Published Paper

EDTM 2019 - 7 纳米及以下工艺的良品率和可靠性挑战

Design for Manufacturing

,

Characterization

Published Paper

EDTM 2019 - 用于鉴定新兴存储器的短流程测试阵列的设计和测量要求

Emerging Memories

,

Characterization

Published Paper

IEEE Transactions 2015 - 用于 FinFET 技术特征描述的接触链

Characterization

,

Yield Management