Panel Discussion With Advantest, Teradyne, PDF Solutions – Download
This presentation, featuring a panel discussion with experts from Advantest, Teradyne, and PDF Solutions, explores real-world advanced test methodologies designed to optimize semiconductor manufacturing. The discussion focuses on leveraging novel data strategies and AI/ML-driven approaches, such as Teradyne’s Archimedes analytics and Advantest’s Vmin tuning applications, to achieve superior yield, operational efficiency, and device performance. Key topics include reducing Vmin test times, optimizing power consumption per core, and utilizing fault prediction models to enhance final test yields.
Download the full presentation to discover how machine learning inference is transforming wafer sort and final test processes.
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