[翻译]
Keynotes & Published Papers Tagged: Design for Manufacturing

Keynotes & Published Papers Tagged: Design for Manufacturing
Published Paper
EDTM 2022 - BEOL 叠加和工艺边际特征描述的新方法
Published Paper
NANOTS 2021 - 利用 DirectScan 进行先进的高通量电子束检测
Published Paper
EDTM 2019 - 7 纳米及以下工艺的良品率和可靠性挑战
Published Paper
SPIE 2009 - 简化以求生存,规范性布局确保向 32 纳米及更先进工艺扩展的盈利能力
Published Paper
SPIE 2009 - 使用常规设计织物简化 OPC 并降低掩模成本
Published Paper
IEEE Transactions 2008 - 纳米级技术中晶体管性能和漏电的变化
Published Paper
ISSM 2006 - 用于热点分析的平版印刷模拟器的快速准确校准方法
Categories
Tags
- AI/ML
- AI Driven Test
- OEE
- Chiplet ecosystem
- DFF
- Agentic AI
- Supply Chain
- Predictive Learning
- FDC
- Emerging Memories
- Parametric Test
- Data
- Compound Semiconductors
- 过程控制
- Manufacturing
- Electric vehicles
- Design for Manufacturing
- Characterization
- Modeling
- Voltage Contrast
- e-Beam
- Yield Management
- Silicon Carbide
- 制造分析