已发表论文

Published Paper

2025 – End-to-End Yield Management for Compound Semiconductors Manufacturing

Compound Semiconductors

,

制造分析

,

Silicon Carbide

,

Yield Management

Published Paper

2025-Full Wafer Inspection for Voltage Contrast Systematic Defects Using High-Throughput Point Scan

e-Beam

,

Voltage Contrast

Published Paper

2025-Stress-related Local Layout Effects in FinFET Technology and Device Design Sensitivity

Silicon Carbide

,

Modeling

Published Paper

2025-Product Design Enhancement with Test Structures for Non-Contact Detection of Yield Detractors

Yield Management

,

e-Beam

,

Characterization

,

Design for Manufacturing

Published Paper

2025-The Overview of Silicon Carbide Technology: Status, Challenges, Key Drivers, and Product Roadmap

Silicon Carbide

,

Electric vehicles

Published Paper

2025-Full-chip Voltage Contrast Inference Using Deep Learning; You Only Look Once: Voltage Contrast (YOLO-VC)

Voltage Contrast

,

e-Beam

Published Paper

2024 – Expediting manufacturing safe launch with Big Data AI/ML analytic solutions on the cloud

Yield Management

,

Manufacturing

Published Paper

EDTM 2022 - 用于检测和监控的新型电子束技术

Yield Management

,

e-Beam

Published Paper

EDTM 2022 - BEOL 叠加和工艺边际特征描述的新方法

Voltage Contrast

,

Design for Manufacturing

Published Paper

NANOTS 2021 - 利用 DirectScan 进行先进的高通量电子束检测

Voltage Contrast

,

Design for Manufacturing

,

过程控制

Published Paper

APCSM 2020 - 将机器学习与先进的异常值检测相结合，提高质量并降低成本

AI/ML

,

Data

Published Paper

IEEE S3S 2019 - FDSOI 技术的表征挑战与解决方案

Yield Management