Scaling Yield Management Intelligence at ams OSRAM – Download
This ams OSRAM presentation details their strategic journey in scaling yield management intelligence through the adoption of Exensio Manufacturing Analytics. It outlines how the company addresses complex manufacturing environments by unifying disparate data sources—including test, process, and defect data—to drive operational excellence and reduce time-to-market. The document further explores their roadmap for AI and Machine Learning integration, highlighting specific use cases like bond void detection and IR failure analysis using advanced modeling techniques such as CatBoost and XGBoost to identify root causes and optimize production yield.
Download the full presentation to explore ams OSRAM’s data-driven approach to manufacturing efficiency.
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